Ti

XPS Reference Database

XPS DB

Periodic Table of Elements

Select an element to view Core Levels & Chemical Shifts

Practical XPS Analysis Protocol

1

Survey Scan Identification

Start by identifying all major elements. Use the periodic table in this tool to check peak positions. Look for major photoemission lines marked with ✦ (e.g., C1s, O1s) and their associated Auger lines.

2

Charge Correction (Calibration)

Insulators accumulate charge, shifting peaks. You must shift the entire spectrum back to a known reference.

  • Standard: Set Adventitious Carbon (C-C/C-H) C 1s to 284.8 eV.
  • Alternative: If no C is present, use a known metal peak (e.g., Au 4f7/2 at 84.0 eV).
  • Note: Apply the same energy shift ($\Delta$E) to all other high-resolution scans.
3

Background Subtraction

Before integrating peaks, remove the inelastic scattering background.

  • Shirley: The standard for most core levels (steps up under the peak).
  • Linear: Only use for very flat backgrounds or short energy ranges.
  • Tougaard: Best for wide scans or peaks with large inelastic tails (e.g., transition metals).
4

Peak Fitting (Deconvolution)

Fit synthetic Gaussian-Lorentzian (GL) curves to experimental data.

Mandatory Constraints (Physics Rules)

  • FWHM: Components in the same orbital (e.g., all C1s states) should have similar Full Width at Half Maximum (±0.2 eV).
  • Doublets (p, d, f orbitals):
    • Area Ratios are fixed: p (1:2), d (2:3), f (3:4).
    • Separation ($\Delta$E) is fixed (check this database).
5

Quantification

Calculate Atomic % using Relative Sensitivity Factors (RSF):

Atomic % = (Area_A / RSF_A) / Σ (Area_i / RSF_i)

Use RSFs specific to your instrument (Kratos, Thermo, PHI) or Scofield cross-sections if generic.